Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light
نویسندگان
چکیده
منابع مشابه
Coherent extreme ultraviolet light amplification by strong-field-enhanced forward scattering.
We theoretically study the response of He atoms exposed simultaneously to an intense IR pulse and a weak extreme ultraviolet (XUV) pulse with photon energies far from the principal atomic He resonances. We find that XUV forward scattering from the nonstationary electronic wave packet promoted by the intense IR driving field is strongly enhanced as compared with the normal weak scattering from b...
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Figure 2. Angular distributions of inelastic scattering around the undiffracted beam and around a beam diffracted through an angle a. The shaded area represents the contribution from the diffracted beam to the intensity collected by an on-axis aperture of semi-angle A3. [6] Egerton, R. F., Electron Energy Loss Spectroscopy in the Electron Microscope, Plenum Press, New York (1986). [7] Steele, J...
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We show experimentally that spectral phase manipulation of ultra-short extreme-UV light pulses can induce and control coherent transient excitation of the He(1s3p) excited state by the nonresonant components of the broadband EUV light. The spectral phase manipulation of the 15th harmonic of an intense 805 nm, 80 fs pulse is achieved by propagation of the EUV light through a variable optical den...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2020
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927620000203